AFM XE-100 (Park System)

Jan 1, 0001

The AFM XE-100 Park System is a powerful Atomic Force Microscope (AFM) designed for high-resolution imaging and nanomechanical characterization of surfaces. It is a cutting-edge instrument that offers high precision and accuracy, making it suitable for a wide range of applications in materials science, biophysics, and other fields. Nanometre resolution images can be obtained with this AFM from samples placed in air or aqueous systems.

The AFM XE-100 can be used for a wide range of specialised modes of operation, including:

True Non-Contact Mode
Contact mode
Lateral Force Microscopy
Force – distance spectroscopy
Conductive AFM
Scanning Tunneling Microscopy
Magnetic Force Microscopy
Electric Force Microscopy
Nanoindentation

Specification

Scanner

Decoupled XY and Z scanner
Height sensing of Z scanner
Scan range of XY scanners: 5 µm or 50 µm
Scan range of Z scanners: 12 µm or 25 µm

Stage

Working range of XY stage: 25 mm × 25 mm (manual precision movement)
Working range of Z stage: 27.5 mm (motorized movement)
Measureable sample size: 80 mm × 80 mm, 20 mm thick, and up to 500 g

Vision

On-axis vision of sample surface and cantilever
Focus range: 20 mm, motorized
Magnification: 780×
Field of view: 480 µm × 360 µm

Software

XEP
- Dedicated system control and data acquisition software
- Adjusting feedback gain, set point, drive frequency/amplitude/phase in real time
- Script-level control through external programs such as LabVIEW (optional)
XEI
- AFM data analysis software (running on Windows, MacOS X, and Linux)